"Siegel, Benjamin M" <br/><br/>
Physical Aspects of Electron Microscopy and Microbeam Analysis 

 - \\197500ENGGPSX 
 - John Wiley   1975  New York  
 - xiii+474 p 
<br/><br/> includes index and biblioraphy 
<br/><br/><label>ISBN: </label>471790206